| 摘要 |
<p>CMOS image sensors are usually suffering from fixed pattern noise and random defect pixels.
A processing device (15) for correcting of at least one defect pixel value of an image sensor unit is proposed, the image sensor unit comprising at least a first and a second pixel array (1,2,3), wherein the image sensor unit is embodied to project the same image onto each pixel array (1,2,3), the processing device (15) comprising at least a first and a second input channel (11,12,13) for receiving pixel values of the first and the second pixel array, respectively, wherein the processing device (15) is operable to exchange the defect pixel value by a corrected pixel value, wherein the corrected pixel value is estimated by evaluating the values of neighbouring pixels of the defect pixel of the same pixel array,
wherein the corrected pixel value is estimated by evaluating values of a corresponding pixel and its neighbouring pixels of the second pixel array at the same location as the defect pixel of the first pixel array in respect to the projected image.</p> |
