发明名称 |
HALFTONE MASK, MANUFACTURING METHOD AND ACTIVE MATRIX TYPE DISPLAY APPARATUS |
摘要 |
<p>A halftone mask, an active matrix type display device, and a method for preparing the halftone mask are provided to inhibit the increase of parasitic capacity and to obtain high definition image display. A halftone mask(500) used for forming a resist pattern having different film thickness comprises a first mask pattern(502) which is used to form a first resist pattern; a second mask pattern(503) which is used to form a second resist pattern having the thickness smaller than that of the first resist pattern; and a third mask pattern(504) which is used to form a third resist pattern formed in at least some part of the edge region of the second mask pattern and having the thickness larger than that of the second resist pattern.</p> |
申请公布号 |
KR20090006024(A) |
申请公布日期 |
2009.01.14 |
申请号 |
KR20080067292 |
申请日期 |
2008.07.10 |
申请人 |
NEC LCD TECHNOLOGIES, LTD. |
发明人 |
AKAGAMI KAZUAKI;KIDO SHUSAKU |
分类号 |
G02F1/1335;G03F1/00;G03F1/68;H01L21/027 |
主分类号 |
G02F1/1335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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