发明名称 HALFTONE MASK, MANUFACTURING METHOD AND ACTIVE MATRIX TYPE DISPLAY APPARATUS
摘要 <p>A halftone mask, an active matrix type display device, and a method for preparing the halftone mask are provided to inhibit the increase of parasitic capacity and to obtain high definition image display. A halftone mask(500) used for forming a resist pattern having different film thickness comprises a first mask pattern(502) which is used to form a first resist pattern; a second mask pattern(503) which is used to form a second resist pattern having the thickness smaller than that of the first resist pattern; and a third mask pattern(504) which is used to form a third resist pattern formed in at least some part of the edge region of the second mask pattern and having the thickness larger than that of the second resist pattern.</p>
申请公布号 KR20090006024(A) 申请公布日期 2009.01.14
申请号 KR20080067292 申请日期 2008.07.10
申请人 NEC LCD TECHNOLOGIES, LTD. 发明人 AKAGAMI KAZUAKI;KIDO SHUSAKU
分类号 G02F1/1335;G03F1/00;G03F1/68;H01L21/027 主分类号 G02F1/1335
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