| 摘要 |
A circuit for outputting internal information of semiconductor memory apparatus is provided to allow a fault analysis due to the fuse cutting by outputting the fuse cutting data to the outside. A fuse circuit(10) comprises the first and the second fuse, and it generates the first and the second fuse cutting signal(fuse cut(1:2)) according to is the cutting state of each fuse. An internal voltage generation unit(20) distributes the reference voltage(Vref) in response to the first and the second fuse cutting signal. The internal voltage generation unit produces the internal voltage(V int) by using the standards distribution voltage. The internal voltage generation unit comprises a decoder(21), a voltage divider(22) and inner voltage generator(23). An information output unit(100) comprises a selecting unit(110) and an output driving part(120). |
