Device for testing electronic components, in particular ICs, with a sealing board arranged within a pressure test chamber

摘要

The apparatus for testing electronic components under given pressures, especially integrated circuits, has a two-part pressure chamber (1,2) with contacts (13) against the component (18). The contacts lie along one chamber part, linked to an electronic test unit. An air-impermeable sealing board (26) lies across the contacts with the contact sections (19,20) on either side of it. A conductive section of the board gives an electrical path between the contact sections. One contact section (19) has a sprung pin (30).