Profilometry apparatus and method of operation

摘要

A profilometry apparatus (12) is provided. The profilometry apparatus (12) includes a fringe projection device (32) configured to project a fringe pattern on an object (22) and an optical unit (34) configured to capture an image of a distorted fringe pattern modulated by the object (22). The profilometry apparatus (12) also includes a signal processing unit (60) configured to process the captured image from the optical unit (34) to filter noise from the image and to obtain real-time estimation of parameters associated with manufacture or repair of the object (22).