发明名称 Multi-point correlated sampling for image sensors
摘要 An improved passive pixel sensor (PPS) circuit comprising a correlated sampling circuit and method that integrates pixel charge leakage onto an integrating amplifier during sampling periods. An integrator circuit is provided for integrating PPS pixel charges received via a column line, and correlated sampling circuit is provided for the removal of kTC noise and dark integration. A multi-point sampling of the output of the integrator is provided wherein at least a first and second correlated sample are used to detect the charge integration from the column line leakages, and at least a third sample is used to detect the PPS signal after pixel readout. The correlated sampling method is employed to remove kTC noise and dark integration from the PPS signal.
申请公布号 US7476836(B2) 申请公布日期 2009.01.13
申请号 US20070898433 申请日期 2007.09.12
申请人 MICRON TECHNOLOGY, INC. 发明人 BOEMLER CHRISTIAN
分类号 H01L27/00;H04N5/359;H04N5/361;H04N5/363;H04N5/374;H04N5/378 主分类号 H01L27/00
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