| 摘要 |
An LCD inspection system of one body probe unit is provided to improve the reliability of the product by aligning a blade of the probe accurately and minimizing the probe repair. A probe unit comprises a probe blade, an upper and lower panel wafers(4, 5), a glass(3) and a FPC. The upper and lower panel wafer are etched through the wafer processing technique to coincide with the fixed projecting part of the probe blade. The upper and lower panel wafer are assembled by inserting a probe blade. Data IC(Integrated Circuit) combined with upper and lower panel wafer is adhered on the glass and FPC(Flexible Printed Circuit). The probe blade is formed to be protruded in the probe unit front end, and visibility is improved. |
