发明名称 Memory having reduced memory cell size
摘要 A memory capable of reducing the memory cell size is provided. This memory includes a first conductive type first impurity region formed on a memory cell array region of the main surface of a semiconductor substrate for functioning as a first electrode of a diode included in a memory cell and a plurality of second conductive type second impurity regions, formed on the surface of the first impurity region at a prescribed interval, each functioning as a second electrode of the diode.
申请公布号 US7476945(B2) 申请公布日期 2009.01.13
申请号 US20050073897 申请日期 2005.03.08
申请人 SANYO ELECTRIC CO., LTD. 发明人 YAMADA KOUICHI
分类号 H01L29/76;G11C11/15;G11C17/06;H01L21/8239;H01L21/8246;H01L23/48;H01L23/52;H01L27/10;H01L27/105;H01L27/112;H01L29/00;H01L29/40;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
代理机构 代理人
主权项
地址