发明名称 NON-VOLATILE MEMORY DEVICE AND FABRICATING METHOD THEREOF
摘要 <p>The non-volatile memory device and manufacturing method thereof are provided to reduce the interference between the floating gates by forming the floating gate of U shape. The floating gate(14) is formed on the substrate(10) with 'U' pattern. One side of the floating gate is recessed. The buffer layer (13A) fills up the recess portion of the floating gate. The tunneling insulating layer(11) is formed between the floating gate and the substrate. The dielectric film(15) is laminated on the floating gate. The recessed portion of the floating gate can be comprised in order to face one direction. The buffer layer can be the oxide film or the nitride film.</p>
申请公布号 KR20090003743(A) 申请公布日期 2009.01.12
申请号 KR20070066663 申请日期 2007.07.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, SEOK WON
分类号 H01L27/115 主分类号 H01L27/115
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