发明名称 SET TOP CALIBRATION PATTERNS IN MANUFACTURING.
摘要 <p>Included are systems and methods for testing functionality of a set top terminal (STT). At least one embodiment of a method includes retrieving a test pattern from a storage device, the test pattern being configured to facilitate testing of at least one component of the STT, decoding the retrieved test pattern, and converting the decoded test pattern to at least one analog signal.</p>
申请公布号 MX2008015983(A) 申请公布日期 2009.01.12
申请号 MX20080015983 申请日期 2007.06.19
申请人 SCIENTIFIC-ATLANTA, INC. 发明人 SAMUEL H. RUSS;LEO MONTREUIL;WAYNE B. WILLIAMS;ROBERT A. KRIETE
分类号 H04N17/00;H04N17/04 主分类号 H04N17/00
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