发明名称 Phase shifting mask for manufacturing semiconductor device and method of fabricating the same
摘要 A phase shifting mask (PSM) for manufacturing a semiconductor device and a method of fabricating the same includes a transparent substrate, a main pattern formed on the transparent substrate and comprising a first phase shifting layer having a first optical transmittance greater than 0, and at least one assistant pattern formed on the transparent substrate proximal to the main pattern for phase-shifting by the same degree as the main pattern and having a second optical transmittance, which is less than the first optical transmittance.
申请公布号 US7473497(B2) 申请公布日期 2009.01.06
申请号 US20050084327 申请日期 2005.03.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM IN-SUNG;LEE JUNG-HYEON;JUNG SUNG-GON
分类号 G03F1/00;G03F1/08;G03F1/14;G03F1/29;G03F1/36;G03F1/54;G03F1/68;G03F1/70;H01L21/027 主分类号 G03F1/00
代理机构 代理人
主权项
地址