发明名称 Method to improve time dependent dielectric breakdown
摘要 In the back end of an integrated circuit employing dual-damascene interconnects, the interconnect members have a first non-conformal liner that has a thicker portion at the top of the trench level of the interconnect; and a conformal second liner that combines with the first liner to block diffusion of the metal fill material.
申请公布号 US7473636(B2) 申请公布日期 2009.01.06
申请号 US20060306825 申请日期 2006.01.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHANDA KAUSHIK;DEMAREST JAMES J.;FILIPPI RONALD G.;IGGULDEN ROY C.;KIEWRA EDWARD W.;MCGAHAY VINCENT J.;WANG PING-CHUAN;WANG YUN-YU
分类号 H01L21/4763 主分类号 H01L21/4763
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