发明名称 Non-volatile memory with programming through band-to-band tunneling and impact ionization gate current
摘要 Electronic circuitry is described having a first transistor having a first gate dielectric located between an electrically floating gate and a semiconductor substrate. The first injection current flows through the first gate dielectric to establish a first amount of electrical charge on the gate electrode. The electronic circuitry also includes a second transistor having a second gate dielectric located between the gate electrode and the semiconductor substrate. A band-to-band tunneling current flows between valence and conduction bands of the second transistor to create a second injection current that flows through the second gate dielectric to establish the first amount of electrical charge on the gate electrode. Non volatile memory cell circuits having the above described circuitry are also described.
申请公布号 US7474568(B2) 申请公布日期 2009.01.06
申请号 US20060601474 申请日期 2006.11.16
申请人 VIRAGE LOGIC CORPORATION 发明人 HORCH ANDREW E.
分类号 G11C11/34 主分类号 G11C11/34
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