发明名称 Method of fabricating a semiconductor device
摘要 A semiconductor device with high reliability is provided using an SOI substrate. When the SOI substrate is fabricated by using a technique typified by SIMOX, ELTRAN, or Smart-Cut, a single crystal semiconductor substrate having a main surface (crystal face) of a {110} plane is used. In such an SOI substrate, adhesion between a buried insulating layer as an under layer and a single crystal silicon layer is high, and it becomes possible to realize a semiconductor device with high reliability.
申请公布号 US7473592(B2) 申请公布日期 2009.01.06
申请号 US20070926573 申请日期 2007.10.29
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI
分类号 H01L21/30;H01L27/12;H01L21/02;H01L21/336;H01L21/762;H01L21/84;H01L29/786 主分类号 H01L21/30
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