发明名称 High-Density Fine Line Structure And Method Of Manufacturing The Same
摘要 A high-density fine line structure mainly includes: two packaged semiconductor devices installed on a circuit layer and a power/ground layer formed therebetween, to realize the objective of high-density and ground connection. On an outer circuit, the part, which is not covered by a solder mask, can be made into a pad for electrically connecting with one of the semiconductor devices. The other semiconductor device may be installed on the fine line circuit layer. The fine line circuit layer, which is exposed, is to be a tin ball pad where a tin ball is filled. Electroplating rather than the etching method is used for forming the fine line circuit layer, and a carrier and a metal barrier layer, which are needed during or at the end of the manufacturing process, are removed to increase the wiring density for realizing the object of high-density.
申请公布号 US2009001547(A1) 申请公布日期 2009.01.01
申请号 US20070772219 申请日期 2007.06.30
申请人 CHANG CHIEN-WEI;LIN TING-HAO 发明人 CHANG CHIEN-WEI;LIN TING-HAO
分类号 H01L23/48;H01L21/58 主分类号 H01L23/48
代理机构 代理人
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