发明名称 Techniques For Generating Bit Reliability Information In The Post Processor
摘要 A detector generates a detected sequence, and a post processor generates probability values that indicate the likelihood of a plurality of error events in the detected sequence. The post processor partitions the values into first and second subsets. The post processor selects a first most likely value from the first subset of the values and a second most likely value from the second subset of the values. The post processor generates a bit reliability based on the first and the second most likely values.
申请公布号 US2009006930(A1) 申请公布日期 2009.01.01
申请号 US20070771226 申请日期 2007.06.29
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS, B.V. 发明人 DJURDJEVIC IVANA;GALBRAITH RICHARD LEO;WILSON BRUCE ALEXANDER;LEE YUAN XING;OENNING TRAVIS ROGER;BLAUM MARIO;LAKOVIC KSENIJA;LI ZONGWANG
分类号 H03M13/00 主分类号 H03M13/00
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