发明名称 |
Resist Composition And Method For Forming Resist Pattern |
摘要 |
A resist composition is obtained by dissolving a resin component (A) that exhibits changed alkali solubility under the action of acid, an oxime sulfonate-based acid generator (B), an amine compound (D) containing at least one alkyl group of 5 to 12 carbon atoms, and an organic acid (E), in an organic solvent (C) containing methyl n-amyl ketone, wherein the component (E) is a dibasic acid.
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申请公布号 |
US2009004598(A1) |
申请公布日期 |
2009.01.01 |
申请号 |
US20050575062 |
申请日期 |
2005.08.19 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
NAKAGAWA YUSUKE;HIDESAKA SHINICHI;NAKAYAMA KAZUHIKO |
分类号 |
G03C1/053;G03C1/00;G03C1/043;G03F7/20 |
主分类号 |
G03C1/053 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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