摘要 |
The present invention relates to a method of fabricating a flash memory device. The method may include forming a first and a second interlayer insulating film on a semiconductor substrate having a cell region, etching the second and first interlayer insulating films, thus forming a contact hole through which a junction region of the cell region is exposed, forming a contact plug within the contact hole, the contact plug having a height lower than that of an interface of the first and second interlayer insulating films, and forming a spacer on sidewalls of the contact hole over the contact plug. |