| 摘要 |
In the case of applying the ABL control to a display device having electron emitters disposed in a matrix, voltage drop caused by the scan line resistance is corrected, thereby displaying a preferable image without a smear. A high voltage load current limiting section for calculating drive voltage alteration data based on a high voltage load current detection signal from a high voltage load current detection section, and a scan voltage correction section for calculating a scan voltage based on the drive voltage alteration data are provided, thus the scan voltage in accordance with the high voltage load current detection signal is output to a scan line selection circuit. Further, a voltage drop correction section is provided to subtract the drive voltage alteration data from the drive voltage data obtained from image data input thereto, and signal voltage data is calculated and is output to the signal line drive circuit 15.
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