发明名称 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN TUNGSTEN CONTACT APPLICATIONS
摘要 Embodiments of the invention described herein generally provide methods for forming cobalt silicide layers and metallic cobalt layers by using various deposition processes and annealing processes. In one embodiment, a method for forming a metallic silicide containing material on a substrate is provided which includes forming a metallic silicide material over a silicon-containing surface during a vapor deposition process by sequentially depositing a plurality of metallic silicide layers and silyl layers on the substrate, depositing a metallic capping layer over the metallic silicide material, heating the substrate during an annealing process, and depositing a metallic contact material over the barrier material. In one example, the metallic silicide layers and the metallic capping layer both contain cobalt. The cobalt silicide material may contain a silicon/cobalt atomic ratio of about 1.9 or greater, such as greater than about 2.0, or about 2.2 or greater.
申请公布号 US2009004850(A1) 申请公布日期 2009.01.01
申请号 US20080111923 申请日期 2008.04.29
申请人 发明人 GANGULI SESHADRI;YU SANG-HO;PHAN SEE-ENG;CHANG MEI;KHANDELWAL AMIT;HA HYOUNG-CHAN
分类号 H01L21/44 主分类号 H01L21/44
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