发明名称 Method of manufacturing an SOI substrate and method of manufacturing a semiconductor device
摘要 It is an object of the present invention is to provide a method of manufacturing an SOI substrate provided with a single-crystal semiconductor layer which can be practically used even when a substrate having a low heat-resistant temperature, such as a glass substrate or the like, is used, and further, to manufacture a semiconductor device with high reliability by using such an SOI substrate. A semiconductor layer which is separated from a semiconductor substrate and bonded to a supporting substrate having an insulating surface is irradiated with electromagnetic waves, and the surface of the semiconductor layer is subjected to polishing treatment. At least part of a region of the semiconductor layer is melted by irradiation with electromagnetic waves, and a crystal defect in the semiconductor layer can be reduced. Further, the surface of the semiconductor layer can be polished and planarized by polishing treatment.
申请公布号 EP2009687(A2) 申请公布日期 2008.12.31
申请号 EP20080010537 申请日期 2008.06.10
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHNUMA, HIDETO;IMAHAYASHI, RYOTA;ILKUBO, YOICHI;MAKINO, KENICHIRO;NAGAMATSU, SHO
分类号 H01L21/762;H01L27/12;H01L29/786 主分类号 H01L21/762
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