发明名称 |
METHOD FOR FORMING WAFER PATTERNS OF SEMICONDUCTOR DEVICES |
摘要 |
<p>A wafer pattern formation method of a semiconductor device is provided to reduce open area in which a wafer pattern is not actually formed on a wafer so that etch bias is predictably stabilized. A wafer pattern formation method of a semiconductor device comprises: a step for setting up layout(200) of circuit patterns(210) in a chip domain of a semiconductor device; a step for arranging a ladder type dummy pattern in which a line and space are repeated in order to fill up an open domain(202) except a domain in which the layout of the circuit patterns is established; and a step for forming the circuit pattern and dummy patterns by transferring the layout of the circuit pattern and dummy pattern(220) by an exposure and etching process on the wafer.</p> |
申请公布号 |
KR20080113726(A) |
申请公布日期 |
2008.12.31 |
申请号 |
KR20070062544 |
申请日期 |
2007.06.25 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, CHUN SOO;SONG, JOO KYOUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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