发明名称 METHOD FOR FORMING WAFER PATTERNS OF SEMICONDUCTOR DEVICES
摘要 <p>A wafer pattern formation method of a semiconductor device is provided to reduce open area in which a wafer pattern is not actually formed on a wafer so that etch bias is predictably stabilized. A wafer pattern formation method of a semiconductor device comprises: a step for setting up layout(200) of circuit patterns(210) in a chip domain of a semiconductor device; a step for arranging a ladder type dummy pattern in which a line and space are repeated in order to fill up an open domain(202) except a domain in which the layout of the circuit patterns is established; and a step for forming the circuit pattern and dummy patterns by transferring the layout of the circuit pattern and dummy pattern(220) by an exposure and etching process on the wafer.</p>
申请公布号 KR20080113726(A) 申请公布日期 2008.12.31
申请号 KR20070062544 申请日期 2007.06.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, CHUN SOO;SONG, JOO KYOUNG
分类号 H01L21/027 主分类号 H01L21/027
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