发明名称 CONDITIONER FOR CHEMICAL MECHANICAL PLANARIZATION PAD
摘要 A method for manufacturing a conditioner for a chemical mechanical planarization pad and the conditioner for the chemical mechanical planarization pad are provided to increase the lifetime of a tool by reducing the breakdown or the separation of an abrasive particle. A metallic board(21) is positioned inside a plating bath. A plurality of penetration holes with a larger diameter than the diameter of an abrasive particle(23) are formed in a non-conductive frame. The non-conductive frame with the thickness of 50 to 100% of the abrasive particle is positioned in the metallic board. The abrasive particle is attached to the metallic board by performing a first plating process for 0.3 to 4 hours after positioning the abrasive particle in the penetration hole. A heavy build up process for 0.5 to 6 hours is performed after removing the non-conductive frame after the first plating process.
申请公布号 KR20080114377(A) 申请公布日期 2008.12.31
申请号 KR20070063873 申请日期 2007.06.27
申请人 EHWA DIAMOND IND. CO., LTD. 发明人 YOUN, SO YOUNG;LEE, JOO HAN;BANG, JUN SUK
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址