发明名称 |
Method for segmenting BIST functionality in an embedded memory array into remote lower-speed executable instructions and local higher-speed executable instructions |
摘要 |
Disclosed is a method for segmenting functionality of a hybrid built-in self test (BIST) architecture for embedded memory arrays into remote lower-speed executable instructions and local higher-speed executable instructions. A standalone BIST logic controller operates at a lower frequency and communicates with a plurality of embedded memory arrays using a BIST instruction set. A block of higher-speed test logic is incorporated into each embedded memory array under test and locally processes BIST instructions received from the standalone BIST logic controller at a higher frequency. The higher-speed test logic includes a multiplier for increasing the frequency of the BIST instructions from the lower frequency to the higher frequency. The standalone BIST logic controller enables a plurality of higher-speed test logic structures in a plurality of embedded memory arrays.
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申请公布号 |
US7472325(B2) |
申请公布日期 |
2008.12.30 |
申请号 |
US20080062599 |
申请日期 |
2008.04.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DREIBELBIS JEFFREY H.;GORMAN KEVIN W.;NELMS MICHAEL R. |
分类号 |
G01R31/28;G01R31/317;G11C7/00;G11C29/00;G11C29/14;G11C29/16;G11C29/44 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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