发明名称 Method and apparatus for bump inspection
摘要 A method of dynamically imaging, calibrating and measuring bump height and coplanarity of a plurality of bumps on a surface is disclosed. The method includes illuminating the plurality of bumps with multispectral light from at least one light source, and receiving light of a first wavelength at an imaging device such that a top view image of at least a portion of the plurality of bumps is captured. The light of the first wavelength is reflected off the plurality of bumps at a first angle from the surface. Light of a second wavelength is received at the imaging device such that at least one oblique side view image of at least a portion of the plurality of bumps is captured. The light of the second wavelength is reflected off the plurality of bumps at a second angle from the surface. The captured images are processed to determine absolute bump height and coplanarity. A corresponding apparatus is also disclosed.
申请公布号 US7471381(B2) 申请公布日期 2008.12.30
申请号 US20060438698 申请日期 2006.05.23
申请人 AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH 发明人 XU JIAN;LIU TONG
分类号 G01N21/00 主分类号 G01N21/00
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