发明名称 Interconnect with high aspect ratio plugged vias
摘要 Described is a method for forming a stackable interconnect. The interconnect is formed by depositing a first contact on a substrate; depositing a seed layer (SL) on the substrate; depositing a metal mask layer (MML) on the SL; depositing a bottom anti-reflection coating (BARC) on the MML; forming a photoresist layer (PR) on the BARC; removing a portion of the PR; etching the BARC and the MML to expose the SL; plating the exposed SL to form a first plated plug; removing the layers to expose the SL; removing an unplated portion of the SL; depositing an inter layer dielectric (ILD) on the interconnect; etching back the ILD to expose the first plated plug; and depositing a second contact on the first plated plug. Using the procedures described above, a second plated plug is then formed on the first plated plug to form the stackable plugged via interconnect.
申请公布号 US7470619(B1) 申请公布日期 2008.12.30
申请号 US20060607494 申请日期 2006.12.01
申请人 HRL LABORATORIES, LLC 发明人 CHEN MARY Y.;LI JAMES CHINGWEI;LAWYER PHILIP H.;SOKOLICH MARKO
分类号 H01L21/44;H01L21/4763 主分类号 H01L21/44
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