Logic built-in self-test channel skipping during functional scan operations

摘要

A method and system for built-in self-testing architecture, including: a logic built-in self-test (LBIST) controller in operable communication with a pseudo-random pattern generator; a multiple input signature register in operable communication with a plurality of scan channels; and circuitry in operable communication with the pseudo-random pattern generator and the multiple input signature register, wherein the circuitry includes a channel skip function which allows selection of any combination of scan channels to skip while scanning.