发明名称 Pattern generator and test apparatus
摘要 A pattern generator includes a main memory for storing a plurality of sequence data blocks for generating a test pattern, a first sequence cache memory for sequentially storing the sequence data blocks, a second sequence cache memory, a data development section for sequentially executing the sequence data blocks stored in the first cache memory and generating a test pattern and a read-ahead means, when the data development section detects a read-ahead instruction on reading ahead the other sequence blocks during executing one sequence data block, for reading the other sequence blocks from the main memory and storing the same in the second sequence cache memory.
申请公布号 US7472327(B2) 申请公布日期 2008.12.30
申请号 US20050295782 申请日期 2005.12.07
申请人 ADVANTEST CORPORATION 发明人 NAKAYAMA HIROYASU
分类号 G01M99/00;G01R31/28;G01R31/3181 主分类号 G01M99/00
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