发明名称 Lithographic apparatus, radiation system, device manufacturing method, and radiation generating method.
摘要 A lithographic apparatus includes a radiation system constructed to provide a beam of radiation from radiation emitted by a radiation source. The radiation system includes a contaminant trap configured to trap material emanating from the radiation source. The contaminant trap includes a contaminant engaging surface arranged in the path of the radiation beam that receives the material emanating from the radiation source during propagation of the radiation beam in the radiation system. The radiation system also includes a liquid tin cooling system constructed to cooling the contaminant trap with liquid tin. The apparatus includes an illumination system configured to condition the radiation beam, a support constructed to support a patterning device configured to impart the radiation beam with a pattern in its cross-section, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto a target portion of the substrate.
申请公布号 NL1035623(A1) 申请公布日期 2008.12.30
申请号 NL20081035623 申请日期 2008.06.25
申请人 ASML NETHERLANDS B.V. 发明人 EDWIN JOHAN BUIS;VADIM YEVGENYEVICH BANINE;TJARKO ADRIAAN RUDOLF VAN EMPEL;MAARTEN JOHANNES WILHELMUS VAN HERPEN;WOUTER ANTHON SOER
分类号 G03F7/20;H01L21/00 主分类号 G03F7/20
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