发明名称 |
Scan sequenced power-on initialization |
摘要 |
A scan sequenced initialization technique supplies a predefined power-on state to a device or module without using explicit reset input to the registers. This technique supplies a predefined pattern to parallel scan chains following power-on reset. The predefined pattern places the device or module in a architecturally specified reset state. The parallel scan chains are required for structural manufacturing test. Once the power-on reset scanning is complete, the power-on reset sequencer indicates completion of state initialization to other circuits.
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申请公布号 |
US7469372(B2) |
申请公布日期 |
2008.12.23 |
申请号 |
US20060381624 |
申请日期 |
2006.05.04 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
NARDINI LEWIS;HALES ALAN D. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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