发明名称 Method of forming high aspect ratio structures
摘要 An etching process includes providing a dielectric first film on a substrate and a sacrificial second film on the dielectric first film. A conductive structure such as a container capacitor is formed in a recess in the first and second films. The conductive structure is exposed as to its external surface by an etch process that resists destructive collapse of the conductive structure.
申请公布号 US7468323(B2) 申请公布日期 2008.12.23
申请号 US20040788899 申请日期 2004.02.27
申请人 MICRON TECHNOLOGY, INC. 发明人 TOREK KEVIN;SHEA KEVIN;GRAETTINGER THOMAS
分类号 H01L21/302;H01L21/02;H01L21/311;H01L21/3213;H01L21/461;H01L21/4763;H01L21/8242;H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/302
代理机构 代理人
主权项
地址