发明名称 High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals
摘要 A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.
申请公布号 US7468516(B2) 申请公布日期 2008.12.23
申请号 US20060479797 申请日期 2006.06.30
申请人 UCHICAGO ARGONNE, LLC 发明人 SMITHER ROBERT K.
分类号 G21K1/06 主分类号 G21K1/06
代理机构 代理人
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