发明名称 Correction method for solid-state detectors and solid-state detector
摘要 To guarantee a largely uncorrupted x-ray image for a solid-state detector with a pixel matrix featuring pixel elements comprising at least two plate elements arranged in one plane, whereby a first and a second plate element exhibit a displacement in relation to one another, a correction method is provided, whereby a digital raw x-ray image is read out from the pixel matrix and a discontinuity generated in the digital raw x-ray image by the displacement of the plate elements in relation to each other is removed at least partly from the image by an image processing correction. In accordance with an embodiment of the invention the second plate element has a displacement from the first plate element and the discontinuity generated is removed at least partly by an image processing correction from the section of the digital x-ray image which is formed by the pixel elements of the displaced second plate element.
申请公布号 US7469038(B2) 申请公布日期 2008.12.23
申请号 US20060499831 申请日期 2006.08.04
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 FINKLER KLAUS;SPAHN MARTIN
分类号 H05G1/64 主分类号 H05G1/64
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