发明名称 TEXTURE MATERIAL MEASURING DEVICE AND TEXTURE MATERIAL MEASURING METHOD
摘要 Nondestructive measurement of crystal grain size is performed surely by removing an oxide film adhering to the surface of a material to be measured. At first, a position on the other side of a rolling product irradiated with a laser beam from an ultrasonic detector is irradiated with a laser beam from a surface removing unit, thus removing an oxide film on the other side of the rolling product. After removing the oxide film on the other side of the rolling product, one side of the rolling product is irradiated with a laser beam from an ultrasonic oscillator to generate ultrasonic oscillation on the other side of the rolling product. The other side of the rolling product is irradiated with a laser beam from the ultrasonic detector and reflecting light from the other side of the rolling product is received by the ultrasonic detector in order to detect ultrasonic oscillation generated on the other side of the rolling product, and crystal grain size of the rolling product is calculated based on the detection results from the ultrasonic detector. ® KIPO & WIPO 2009
申请公布号 KR20080110744(A) 申请公布日期 2008.12.19
申请号 KR20087021993 申请日期 2008.09.09
申请人 TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION 发明人 OHARA KAZUHIRO;SANO MITSUHIKO;IMANARI HIROYUKI;TSUGENO MASASHI;KITAGOH KAZUTOSHI
分类号 G01N29/00;G01N29/04 主分类号 G01N29/00
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