| 摘要 |
A wafer display method is provided to accurately distinguish the count of wafers which are carried in or carried out by indicating wafers in order to be classified into a constant unit number. An wafer display method comprises: a step which indicates a plurality of wafers(WFD) successively loaded in order to be classified on screen at the fixation number; and a step which distinguishes the count of wafers which are carried in or carried out through the classified display. The indicating step comprises indicating the group of wafers with a fixed number in order to be separated. The indicating step comprises indicating wafers longer or shorter or thicker according to a fixed number.
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