发明名称 X-RAY CT APPARATUS
摘要 PROBLEM TO BE SOLVED: To reduce the influence of cosmic rays, etc. in the calibration of an X-ray CT apparatus. SOLUTION: In the calibration performed by actual irradiation/detection with a fan beam 12, an X-ray generator 10 and an X-ray detector 20 are disposed in the horizontal direction (in the x-axis direction). Specifically, the X-ray generator 10 and the X-ray detector 20 are moved as a rotary base 72 is rotated by a rotating mechanism 70, and the normal of the detection face of the semiconductor device array 22 is turned approximately in the horizontal direction. As the possibility of muons coming approximately in the vertical direction (in the z-axis direction) is high, the possibility of muons flying into the detection face can be reduced by turning the normal of the detection face of the semiconductor device array 22 approximately in the horizontal direction. As a result, the calibration including the detection of X rays is hardly affected by muons, etc., and therefore, the calibration can be more accurately performed. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008302066(A) 申请公布日期 2008.12.18
申请号 JP20070152787 申请日期 2007.06.08
申请人 ALOKA CO LTD 发明人 OTOMO NAOKI;KITAGAWA SHIGERU;HOSOBE TAKASHI;KOBAYASHI MASAKI;YAMASHITA FUMIAKI
分类号 A61B6/03 主分类号 A61B6/03
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