| 摘要 |
Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support a plurality of inspection sensors typically arranged in an ordered matrix array and possibly with one or more additional inspection sensors aligned for inspection of difficult to inspect features of a structure such as radius corner or edge features. Rapid prototype integrated matrix array inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.
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