发明名称 DOT MEASUREMENT METHOD AND APPARATUS
摘要 A dot measurement method includes: a line pattern forming step of forming line patterns on the ejection receiving medium; a pattern reading step of capturing an image of the line patterns; a profile graph acquiring step of acquiring profile graphs for each of the line patterns; a characteristic position calculating step of calculating extreme value positions, first edge positions and second edge positions for each of the line patterns; an approximation line calculating step of calculating a line-center approximation line, a first edge approximation line and a second edge approximation line; a line width calculating step of calculating a line width; a correlation information acquiring step of beforehand acquiring at least one of a first relationship between the line width and the dot diameter, and a second relationship between the line width and the ejection volume; and a measurement value calculating step of calculating at least one of the dot diameter and the ejection volume in accordance with the line width and the at least one of the first and second relationships.
申请公布号 US2008309703(A1) 申请公布日期 2008.12.18
申请号 US20080138211 申请日期 2008.06.12
申请人 YAMAZAKI YOSHIROU 发明人 YAMAZAKI YOSHIROU
分类号 B41J29/393 主分类号 B41J29/393
代理机构 代理人
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