发明名称 |
HACKING DETECTOR OF SEMICONDUCTOR INTEGRATED CIRCUIT AND DETECTING METHOD THEREOF |
摘要 |
A hacking detector of a semiconductor integrated circuit is provided to detect where a semiconductor is hacked or not by using parasitic capacitance while reducing the size of a detection capacitor. A hacking detector of a semiconductor integrated circuit includes a precharge capacitor(C1) connected to a precharged check node(CHK) and a detection capacitor(C3) for discharging the check node(C3), and also includes a detector(100) detects whether the detection capacitor was exposed to outside or not according to the voltage level of the check node when a certain time passes. The capacitance of the detection capacitor is larger than that of a precharged capacitor. |
申请公布号 |
KR20080110089(A) |
申请公布日期 |
2008.12.18 |
申请号 |
KR20070058412 |
申请日期 |
2007.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SEUNG WON |
分类号 |
G11C29/00;G11C5/14 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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