发明名称 HACKING DETECTOR OF SEMICONDUCTOR INTEGRATED CIRCUIT AND DETECTING METHOD THEREOF
摘要 A hacking detector of a semiconductor integrated circuit is provided to detect where a semiconductor is hacked or not by using parasitic capacitance while reducing the size of a detection capacitor. A hacking detector of a semiconductor integrated circuit includes a precharge capacitor(C1) connected to a precharged check node(CHK) and a detection capacitor(C3) for discharging the check node(C3), and also includes a detector(100) detects whether the detection capacitor was exposed to outside or not according to the voltage level of the check node when a certain time passes. The capacitance of the detection capacitor is larger than that of a precharged capacitor.
申请公布号 KR20080110089(A) 申请公布日期 2008.12.18
申请号 KR20070058412 申请日期 2007.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SEUNG WON
分类号 G11C29/00;G11C5/14 主分类号 G11C29/00
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