| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of easily modifying the timing of a control signal inside the semiconductor device and an internal power supply. SOLUTION: The semiconductor device has an on chip compare test function of comparing the internal signal generated inside with an expected value input from the outside and recognizing the operation. The semiconductor device comprises a counter for counting the order of test conditions used by every on chip test during on chip compare test mode, a test condition selection circuit for sequentially selecting different test conditions in response to the counted value of the counter, and an operation condition setting circuit for fixing the state of the internal connection to the test condition corresponding to the counted value of the counter. COPYRIGHT: (C)2009,JPO&INPIT
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