发明名称 ELECTRONIC DEVICE AND METHOD FOR ON CHIP JITTER MEASUREMENT
摘要 <p>The present invention relates to an integrated electronic device for digital signal processing, which includes a reference clock input for receiving a reference clock, a phase locked loop (PLL), a phase interpolator (PI) coupled to the phase locked loop (PLL) for shifting a phase of an output clock signal of the PLL in a stepwise manner so as to generate a shifted output clock signal (PHI_out), a logic stage for determining the state of the reference clock signal (REF_CLK) multiple times during an edge of the shifted output clock for each phase shift, a storing means for storing information whether or not the determined state of the reference clock signal (REF_CLK) is stable for a phase of the shifted output clock signal (PHI_out), and an interface configured to read out the stored information for determining the jitter of the shifted output clock signal (PHI_OUT).</p>
申请公布号 WO2008152082(A1) 申请公布日期 2008.12.18
申请号 WO2008EP57354 申请日期 2008.06.12
申请人 TEXAS INSTRUMENTS DEUTSCHLAND GMBH;HERMANN, FRANZ 发明人 HERMANN, FRANZ
分类号 G01R31/317;G01R31/30;H04L1/20 主分类号 G01R31/317
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