发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method thereof, which can house a compact semiconductor element such as a semiconductor device of chip size in a substrate, moreover, is high in inspection efficiency. <P>SOLUTION: In a semiconductor device 1 which is constituted by housing a semiconductor chip 20 of wafer level package type in a substrate 10, a bump electrode 20b whose cross sectional shape is concave is provided on the semiconductor chip 20, on the semiconductor chip 20, a wiring substrate 30 in which a sharp-pointed electrode terminal 30c is provided is arranged, the sharp-pointed electrode terminal 30a is received in the concave portion of the bump electrode 20b and pressure-welded. Thereby, the semiconductor device constituted by housing the semiconductor package in the substrate 10 is actualized with lower cost and high reliability. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008305931(A) 申请公布日期 2008.12.18
申请号 JP20070151092 申请日期 2007.06.07
申请人 FUJITSU MICROELECTRONICS LTD 发明人 TSUKAGOSHI JUN;MATSUKI HIROHISA;AIBA YOSHITAKA
分类号 H01L23/12;H01L21/60;H05K1/18;H05K3/32;H05K3/46 主分类号 H01L23/12
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