发明名称 SENSING CIRCUIT FOR MEMORIES
摘要 A memory apparatus includes a plurality of memory units, a sensing circuit and a bias-generating circuit. The plurality of memory units respectively outputs a data current to the sensing circuit, while the sensing circuit further includes a plurality of first transistors, a plurality of second transistors and a plurality of sensing amplifiers. In order to speed up the access time of the memory units, the bias-generating circuit rapidly provides a bias signal to the sensing circuit to turn on the first transistors of the sensing circuit. In the present invention, the sensing circuit uses a common reference voltage to reduce the circuit utilization area of the memory apparatus.
申请公布号 US2008310235(A1) 申请公布日期 2008.12.18
申请号 US20070763900 申请日期 2007.06.15
申请人 EMEMORY TECHNOLOGY INC. 发明人 LIN CHUN-HUNG;CHEN YIN-CHANG
分类号 G11C11/4091 主分类号 G11C11/4091
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