| 摘要 |
PROBLEM TO BE SOLVED: To provide a delay measuring instrument which can measure a delay value in a semiconductor device, suppresses an increase in circuit scale, and generates less noise. SOLUTION: The delay measuring instrument A disposed in the semiconductor device includes a flip-flop (storage element) 1 which takes an input data value in at an edge of a clock CK and holds it, a delay element 2 connected to an inverted output terminal NQ of the flip-flop 1, a selector 3 which selects and outputs one of an external input data value Din and a delay output data value DL of the delay element 2 to the flip-flop 1, and a measurement result output terminal O1 connected to a non-inverted output terminal of the flip-flop 1. When a selection signal SE of the selector 2 is "1", the flip-flop 1 inputs the external input data value Din and takes it in at a leading edge of the clock CK. When the selection signal SE is "0", on the other hand, the delay output data DL is input and taken in at a leading edge of the clock CK. COPYRIGHT: (C)2009,JPO&INPIT
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