发明名称 Real-Time, 3D, Non-Linear Microscope Measuring System and Method for Application of the Same
摘要 A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.
申请公布号 US2008308730(A1) 申请公布日期 2008.12.18
申请号 US20060814917 申请日期 2006.01.27
申请人 VIZI SZILVESZTER E;SZIPOCS ROBERT;ROZSA BALAZS;MAAK PAL;FEKETE JULIA;VALENTA LASZLO;KATONA GERGELY;KALLO PETER;OSVAY KAROLY 发明人 VIZI SZILVESZTER E.;SZIPOCS ROBERT;ROZSA BALAZS;MAAK PAL;FEKETE JULIA;VALENTA LASZLO;KATONA GERGELY;KALLO PETER;OSVAY KAROLY
分类号 G01N23/00;G02B21/00;G02B21/16;G02B21/22 主分类号 G01N23/00
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