发明名称 |
Real-Time, 3D, Non-Linear Microscope Measuring System and Method for Application of the Same |
摘要 |
A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.
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申请公布号 |
US2008308730(A1) |
申请公布日期 |
2008.12.18 |
申请号 |
US20060814917 |
申请日期 |
2006.01.27 |
申请人 |
VIZI SZILVESZTER E;SZIPOCS ROBERT;ROZSA BALAZS;MAAK PAL;FEKETE JULIA;VALENTA LASZLO;KATONA GERGELY;KALLO PETER;OSVAY KAROLY |
发明人 |
VIZI SZILVESZTER E.;SZIPOCS ROBERT;ROZSA BALAZS;MAAK PAL;FEKETE JULIA;VALENTA LASZLO;KATONA GERGELY;KALLO PETER;OSVAY KAROLY |
分类号 |
G01N23/00;G02B21/00;G02B21/16;G02B21/22 |
主分类号 |
G01N23/00 |
代理机构 |
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