A SPECTROSCOPIC IMAGING METHOD AND SYSTEM FOR EXPLORING THE SURFACE OF A SAMPLE

摘要

The present invention concerns a spectroscopic imaging method and system for exploring the surface (2) of a sample (1 ). The spectroscopic imaging system comprising a microscopic or macroscopic device comprising an objective (5), a housing (6) including a spectroscope, and scanning means (1 1 ) disposed between the objective (5) of the microscopic or macroscopic device and the spectroscope and being able to scan the sample surface (2) in two directions X and Y in order to illuminate a scanned area on the sample surface (2). According to the invention, during the scanning of the excitation beam (8) on the scanned area, the energy of the emitted light beam (9) measured on the scanned area is integrated on the pixels of the detection means (10), generating average spectral data for each line of pixels, storage means (12) are connected to the detection means (10), said average spectral data of each line of pixels being transferred toward the storage means (12), and said storage means (12) comprising a memory able to store average spectral data of M lines of pixels, and an imaging device (13) is connected to the storage means (12), said average spectral data of M lines of pixels being send simultaneously toward said imaging device (13) in order to obtain an average spectroscopic image of the scanned area.