发明名称 Semiconductor structure and method
摘要 Semiconductor structure formed from a semiconductor body having an impurity of one conductivity type therein and having a major surface lying in a <100> plane. Moats are provided which extend through the major surface and have spaced side walls lying in a plane different from the <100 > plane and at said surface define spaced islands. Layers of protective material are formed on the side walls of the moats. Regions of said impurity of one conductivity type and of greater concentration than that in the body extend downwardly into the body from the protective layers. An insulating material fills the moats and devices are formed in the islands. An insulating layer is formed on said surface and lead means is provided on the insulating layer and extends through the insulating layer to make contact to the devices and extends over the material in said moats to interconnect the devices in the spaced islands. It is desirable that the moats have a generally rectangular configuration with inner and outer perimeters and inner and outer corners. The outer corners are defined by diagonal, generally planar wall portions which lie in either the <110> plane or the < 111> plane. If desired, the bottom of the moats can extend downwardly until the side walls form a Vee in cross-section.
申请公布号 US3883948(A) 申请公布日期 1975.05.20
申请号 US19740429933 申请日期 1974.01.02
申请人 SIGNETICS CORPORATION 发明人 ALLISON, DAVID F.
分类号 H01L21/00;H01L21/763;H01L27/00;H01L29/00;(IPC1-7):B01J17/00 主分类号 H01L21/00
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