发明名称 DEVICE FOR TREATING IC AT HIGH SPEED
摘要 An apparatus for the high-speed handling of integrated circuit parts. The apparatus consists essentially of two parts, a test wheel and a sort wheel. It singulates parts from a reservoir of untested parts, moves the parts to electrical contacts for test, moves the tested part out of the contacts and sorts the part into the proper bin.
申请公布号 JPS53107277(A) 申请公布日期 1978.09.19
申请号 JP19780017480 申请日期 1978.02.17
申请人 MOTOROLA INC 发明人 MIRO UEIN FURISUBII;MAABIN KURIFU SUWAPU
分类号 G01R31/26;B07C5/344;B07C5/36;B65G47/08;H01L21/66 主分类号 G01R31/26
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