发明名称 Apparatus for measuring the waviness of a workpiece surface
摘要 An apparatus for measuring the roundness and waviness of workpiece surfaces comprises a first peak-to-peak detector for detecting the absolute peak-to-peak value of the sum of a signal representative of the roundness error of the workpiece and a signal representative of the eccentric center of the workpiece. A low-pass filter passes only the low frequency eccentricity signal which is applied to a second peak-to-peak detector for detecting the absolute peak-to-peak value thereof. The outputs from both detecting devices are fed to an arithmetic means for effecting subtraction of the absolute value of the output signal from the second peak-to-peak detector from that of the first peak-to-peak detector thereby obtaining a signal representative of the peak or maximum amount of waviness of the workpiece surface at or near the point of maximum eccentricity error and unaffected by any eccentricity error.
申请公布号 US4184263(A) 申请公布日期 1980.01.22
申请号 US19770818961 申请日期 1977.07.25
申请人 SEIKO SEIKI K K 发明人 HACHISU, MASUO;TATSUMI, YOUJI
分类号 G01B7/28;(IPC1-7):G01B7/12;G01B7/31;G06G7/78 主分类号 G01B7/28
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