| 摘要 |
PURPOSE:To attain high space resolution, high sensitivity and rapid photography by decomposing a diffracted X-ray image into picture elements by two slits, by measuring and storing X-ray intensity by a counter and then by displaying it on a display by synthesizing. CONSTITUTION:X-rays emitted by X-ray source 1 are caused to strike sample crystal 3 by way of incident slit 2. Incident X-rays are separated by sample crystal 3 into diffracted X-rays 4 and transmitted X-rays 5 and diffracted X-rays 4 having intensity distribution in the Y-axial direction in accordance with a lattice defect in sample crystal 3 are measured through the scanning of slit 6 for diffracted X-rays. With regard to dimensions of picture elements in sample crystal 3, DELTAx, and DELTAy are determined by the interval between slits 2 and 6 and the output of counter 7 is stored in a memory temporarily together with information on the movement of slits 2 and 6, so that diffracted X-rays of the whole crystal will be displayed by synthesizing. In the constitution like this, the interval between slits 2 and 6 is reduced and a counter of 100% detection efficiency is employed, so that high space resolution, high sensitivity and rapid photography can be attained. |
